Trap Level Spectroscopy in Amorphous Semiconductors (Elsevier Insights)
Author(s)
Mikla, Victor V.
Mikla, Victor I
Mikla, Victor V.
Mikla, Victor I
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most common spectroscopic techniques but also describes their advantages and disadvantages.
- Provides information on the most used spectroscopic techniques
- Discusses the advantages and disadvantages of each technique
Keywords
Physical & Theoretical, Spectroscopy & Spectrum Analysis, Materials Science, Condensed Matter, General, Physical & Earth Sciences -> Chemistry -> Physical Chemistry, Trades & Technology -> Industrial Technology -> Materials Science, Physical & Earth Sciences -> Physics -> General, Physical & Earth Sciences -> Physics -> Condensed Matter
Physical & Theoretical, Spectroscopy & Spectrum Analysis, Materials Science, Condensed Matter, General, Physical & Earth Sciences -> Chemistry -> Physical Chemistry, Trades & Technology -> Industrial Technology -> Materials Science, Physical & Earth Sciences -> Physics -> General, Physical & Earth Sciences -> Physics -> Condensed Matter
| Name in long format: | Trap Level Spectroscopy in Amorphous Semiconductors (Elsevier Insights) |
|---|---|
| ISBN-10: | 012384715X |
| ISBN-13: | 9780123847157 |
| Book pages: | 128 |
| Book language: | en |
| Edition: | 1 |
| Binding: | Hardcover |
| Publisher: | Elsevier |
| Dimensions: | Height: 9.01573 Inches, Length: 5.98424 Inches, Weight: 0.881849048 Pounds, Width: 0.3751961 Inches |
