Thin Films for Emerging Applications (Volume 16) (Physics of Thin Films, Volume 16)
High-t Superconducting Thin Films -- Permanent Magnet Thin Films: A Review Of Film Synthesis And Properties -- Lateral Diffusion And Electromigration In Metallic Thin Films -- Fracture And Cracking Phenomena In Thin Films Adhering To High-elongation Substrates. Edited By Maurice H. Francombe, John L. Vossen. Includes Bibliographical References And Indexes.
Keywords
Thin films, QC176.A1 H35 v.16
Thin films, QC176.A1 H35 v.16
Name in long format: | Thin Films for Emerging Applications (Volume 16) (Physics of Thin Films, Volume 16) |
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ISBN-10: | 0125330162 |
ISBN-13: | 9780125330169 |
Book pages: | 367 |
Book language: | en |
Edition: | 1 |
Binding: | Hardcover |
Publisher: | Academic Press |
Dimensions: | Weight: 1.763698096 Pounds |