Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 2)

Author(s)

Name in long format: Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces (Oxford Series in Optical and Imaging Sciences, 2)
ISBN-10: 0195062701
ISBN-13: 9780195062700
Book pages: 272
Book language: en
Edition: First Edition
Binding: Hardcover
Publisher: Oxford University Press
Dimensions: Height: 9.5 Inches, Length: 6.25 Inches, Weight: 1.42418621252 Pounds, Width: 0.782 Inches

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