Radio Frequency/microwave Robust Design Techniques Applied To A Transistor Amplifier Test Fixture (the Six Sigma Research Institute Series)
Author(s)
Loren F. Root
Loren F. Root
Name in long format: | Radio Frequency/microwave Robust Design Techniques Applied To A Transistor Amplifier Test Fixture (the Six Sigma Research Institute Series) |
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ISBN-10: | 0201634287 |
ISBN-13: | 9780201634280 |
Book pages: | 34 |
Edition: | 1 |
Binding: | Paperback |
Publisher: | Addison-wesley |