New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing

Edited By David J. Weiss. Derived From A Conference Sponsored By The U.s. Office Of Naval Research. Includes Bibliographies And Indexes.

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Name in long format: New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing
ISBN-10: 0127427805
ISBN-13: 9780127427805
Book pages: 345
Book language: en
Edition: 1
Binding: Kindle Edition
Publisher: Academic Press

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