New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing
Edited By David J. Weiss. Derived From A Conference Sponsored By The U.s. Office Of Naval Research. Includes Bibliographies And Indexes.
Name in long format: | New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing |
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ISBN-10: | 0127427805 |
ISBN-13: | 9780127427805 |
Book pages: | 345 |
Book language: | en |
Edition: | 1 |
Binding: | Kindle Edition |
Publisher: | Academic Press |