New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing
Edited By David J. Weiss. Derived From A Conference Sponsored By The U.s. Office Of Naval Research. Includes Bibliographies And Indexes.
| Name in long format: | New Horizon Testing: Latent Trait Test Theory and Computerized Adaptive Testing |
|---|---|
| ISBN-10: | 0127427805 |
| ISBN-13: | 9780127427805 |
| Book pages: | 345 |
| Book language: | en |
| Edition: | 1 |
| Binding: | Kindle Edition |
| Publisher: | Academic Press |
