Elastic and Inelastic Scattering in Electron Diffraction and Imaging (NATO Asi Series)
Zhong-lin Wang
This unique volume provides comprehensive coverage of the theories and techniques of elastic and inelastic electron diffraction and imaging as well as their applications in quantitative structure determination using transmission and scanning transmission electron microscopy. The author summarizes principles, techniques, and applications in his discussions of thermal diffusely scattered, valence-loss, and atomic inner-shell scattered electrons in compositional sensitive imaging.
Booknews
Explains the physics involved in electron diffraction and imaging and related applications for materials characterization, emphasizing the diffraction and imaging of inelastically scattered electrons. The goal is to help readers understand phenomena observed in electron microscopy from the perspective of diffraction physics. Assumes previous knowledge of electron microscopy, electron diffraction, and quantum mechanics. The topics include the Bloch wave and the multislice theories, reciprocity, high-resolution transmission imaging, and multiple scattering. Annotation c. Book News, Inc., Portland, OR (booknews.com)
Technology - General & Miscellaneous, Applied Science, Science - Applied, Physics, Theories of Science
Name in long format: | Elastic and Inelastic Scattering in Electron Diffraction and Imaging (NATO Asi Series) |
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ISBN-10: | 0306449293 |
ISBN-13: | 9780306449291 |
Book pages: | 476 |
Book language: | en |
Edition: | 1995 |
Binding: | Hardcover |
Publisher: | Springer |
Dimensions: | Height: 9 Inches, Length: 6 Inches, Weight: 4.2769678828 Pounds, Width: 1.25 Inches |