Advances in Imaging and Electron Physics: Part B
Author(s)
Cremer, Jr., Jay Theodore
Cremer, Jr., Jay Theodore
This special volume of Advances in Imaging and Electron Physics details the current theory, experiments, and applications of neutron and x-ray optics and microscopy for an international readership across varying backgrounds and disciplines. Edited by Dr. Ted Cremer, these volumes attempt to provide rapid assimilation of the presented topics that include neutron and x-ray scatter, refraction, diffraction, and reflection and their potential application.
Key features:
* Contributions from leading authorities * Informs and updates on all the latest developments in the field
Keywords
Microelectronics, Mechanical, Data Processing, Optics, General, Materials Science, Trades & Technology -> Industrial Technology -> Materials Science, Professional, Career & Trade -> Electronics -> General, Trades & Technology -> Technology & Engineering -> Optics, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical
Microelectronics, Mechanical, Data Processing, Optics, General, Materials Science, Trades & Technology -> Industrial Technology -> Materials Science, Professional, Career & Trade -> Electronics -> General, Trades & Technology -> Technology & Engineering -> Optics, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical
| Name in long format: | Advances In Imaging And Electron Physics, Volume 173: Part B |
|---|---|
| ISBN-10: | 0123969697 |
| ISBN-13: | 9780123969699 |
| Book pages: | 540 |
| Book language: | English |
| Edition: | 2 |
| Binding: | eBook |
| Publisher: | Elsevier S & T |
