Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 168)
Author(s)
Hawkes, Peter W.
Hawkes, Peter W.
Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
* Contributions from leading international scholars and industry experts
* Discusses hot topic areas and presents current and future research trends
* Invaluable reference and guide for physicists, engineers and mathematicians
Keywords
Electron Microscopes & Microscopy, Microscopes & Microscopy, Imaging Systems, Mathematical & Computational, Digital, Microelectronics, Mechanical, Hydraulics, Data Processing, Materials Science, Optics, General, Trades & Technology -> Industrial Technology -> Materials Science, Trades & Technology -> Technology & Engineering -> Imaging Systems, Professional, Career & Trade -> Electronics -> General, Trades & Technology -> Technology & Engineering -> Optics, Trades & Technology -> Technology & Engineering -> Hydraulics, Physical & Earth Sciences -> Physics -> Microscopes & Microscopy, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical, Physical & Earth Sciences -> Physics -> Mathematical Physics
Electron Microscopes & Microscopy, Microscopes & Microscopy, Imaging Systems, Mathematical & Computational, Digital, Microelectronics, Mechanical, Hydraulics, Data Processing, Materials Science, Optics, General, Trades & Technology -> Industrial Technology -> Materials Science, Trades & Technology -> Technology & Engineering -> Imaging Systems, Professional, Career & Trade -> Electronics -> General, Trades & Technology -> Technology & Engineering -> Optics, Trades & Technology -> Technology & Engineering -> Hydraulics, Physical & Earth Sciences -> Physics -> Microscopes & Microscopy, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical, Physical & Earth Sciences -> Physics -> Mathematical Physics
| Name in long format: | Advances in Imaging and Electron Physics: Optics of Charged Particle Analyzers (ISSN Book 168) |
|---|---|
| ISBN-10: | 0123859832 |
| ISBN-13: | 9780123859839 |
| Book pages: | 392 |
| Book language: | en |
| Edition: | 1 |
| Binding: | Kindle Edition |
| Publisher: | Academic Press |
