Fundamentals Of Surface And Thin Film Analysis

Author(s)

Leonard C. Feldman, James W. Mayer. Includes Bibliographical References And Index.

Keywords
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Name in long format: Fundamentals Of Surface And Thin Film Analysis
ISBN-10: 0135005701
ISBN-13: 9780135005705
Book language: en
Edition: 1
Binding: Paperback
Publisher: P T R Prentice Hall
Dimensions: xviii, 352 p. : ill. ; 24 cm.

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