Advances in Imaging and Electron Physics (Volume 142)
Author(s)
Hawkes, Peter W.
Hawkes, Peter W.
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Keywords
Electron Microscopes & Microscopy, Microscopes & Microscopy, Imaging Systems, Materials Science, General, Data Processing, Mechanical, Microelectronics, Trades & Technology -> Industrial Technology -> Materials Science, Trades & Technology -> Technology & Engineering -> Imaging Systems, Professional, Career & Trade -> Electronics -> General, Physical & Earth Sciences -> Physics -> Microscopes & Microscopy, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical
Electron Microscopes & Microscopy, Microscopes & Microscopy, Imaging Systems, Materials Science, General, Data Processing, Mechanical, Microelectronics, Trades & Technology -> Industrial Technology -> Materials Science, Trades & Technology -> Technology & Engineering -> Imaging Systems, Professional, Career & Trade -> Electronics -> General, Physical & Earth Sciences -> Physics -> Microscopes & Microscopy, Professional, Career & Trade -> Computer Science -> Data Processing, Trades & Technology -> Industrial Technology -> Mechanical
Name in long format: | Advances in Imaging and Electron Physics (Volume 142) |
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ISBN-10: | 012014784X |
ISBN-13: | 9780120147847 |
Book pages: | 352 |
Book language: | en |
Edition: | 1 |
Binding: | Hardcover |
Publisher: | Academic Press |
Dimensions: | Height: 9 Inches, Length: 6 Inches, Weight: 1.4550509292 Pounds, Width: 0.75 Inches |